MarSurf | 3D surface measurement

MarSurf WI 100

Art. no. 6355002

High-performance laboratory and QA system

The MarSurf WI 100 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf WI 100
High-performance laboratory and QA system

The high-end MarSurf WI 100 instrument features an extended working area in xyz direction for especially large sample volumes: Simply press the side adjustment used to move the additional manual Z-axis and measure the XXL components.
The MarSurf WI 100 is suitable for use in test laboratories and  equipped for quality assurance in production environments due to its robust construction.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf WI 100 | Art.-Nr. 6355002
Measuring speed up to 140 fps
Resolution up to 0.2 (nm) vertical
Measuring principle White light interferometer
High-power LED (650 nm / white)

Other Collision detection in xyz direction
Power supplied 100 - 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178 …
Dimensions

Variety of applications for our products

Machine building
Qualification and quantification of the roughness, geometry, and wear volume

Electronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free products

Medical technology
Quality assurance of medical surfaces in production and the laboratory

Materials science
Optimization of functional features on new surfaces and products
 
Micro-system technology
Measurement of complex surface geometries of the smallest components with nanometer precision
Datasheet
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Freely programmable measuring sequences
Fully automated, database-based pallet measurements with automated measuring and evaluation sequence (user-dependent one click solution).
Intuitive handling
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
MarSurf | 3D surface measurement

MarSurf WI 100

Art. no. 6355002

High-performance laboratory and QA system

The MarSurf WI 100 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf WI 100
High-performance laboratory and QA system

The high-end MarSurf WI 100 instrument features an extended working area in xyz direction for especially large sample volumes: Simply press the side adjustment used to move the additional manual Z-axis and measure the XXL components.
The MarSurf WI 100 is suitable for use in test laboratories and  equipped for quality assurance in production environments due to its robust construction.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf WI 100 | Art.-Nr. 6355002
Measuring speed up to 140 fps
Resolution up to 0.2 (nm) vertical
Measuring principle White light interferometer
High-power LED (650 nm / white)

Other Collision detection in xyz direction
Power supplied 100 - 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178 …
Dimensions

Variety of applications for our products

Machine building
Qualification and quantification of the roughness, geometry, and wear volume

Electronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free products

Medical technology
Quality assurance of medical surfaces in production and the laboratory

Materials science
Optimization of functional features on new surfaces and products
 
Micro-system technology
Measurement of complex surface geometries of the smallest components with nanometer precision
Datasheet
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Freely programmable measuring sequences
Fully automated, database-based pallet measurements with automated measuring and evaluation sequence (user-dependent one click solution).
Intuitive handling
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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