MarSurf | 3D surface measurement

MarSurf WI 50 M

Art. no. 6355000

Entry-level system

The MarSurf WI 50M is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf WI 50 M
MarSurf WI 50 M
High performance entry-level solution

Precise measurement in the sub-nanometer range – simple with the new MarSurf WI 50 M. With an intuitive software user guide and very user-friendly design, this 3D measuring instrument is ideal for everyday use in the laboratory and quality management.
The new WI 50 M meets all the requirements of your measuring tasks in the nanometer range – offering maximum performance and impressive value for money. With a minimalistic approach, compact design and large installation space, the tool lives up to its reputation as “an optimal entry-level solution.  

Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf WI 50 M | Art. no. 6355000
Resolution up to 0.2 (nm) vertical
Measuring speed up to 140 fps
Measuring principle

High-performance LED (650 nm / white)

Power supplied 100 - 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178 …

Variety of applications for our products

Mechancial engineering
Qualification and quantification of the roughness, geometry, and wear volume

Electronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free products

Medical technology
Quality assurance of medical surfaces in production and the laboratory

Materials science
Optimization of functional features on new surfaces and products
Microsystems technology
Measurement of complex surface geometries of the smallest components with nanometer precision
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Wide range of workpieces
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Intuitive handling
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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