MarSurf | 3D profilometry

MarSurf CP / CL select

Art. no. 6350010

Established optical profilometry for QA

Optical profilometers with which you can complete two- and three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.

MarSurf CP / CL <i>select</i>
MarSurf CP / CL <i>select</i>
Flexible solution for quality control

The MarSurf CP select stands out for extremely fast recording of large measuring surfaces while also ensuring high measuring precision.  Thanks to its modular design, the measuring system can be adjusted to various measuring tasks and individual automation, measuring convenience, and accuracy requirements. 

Typical measuring tasks
  • Roughness measurements as per ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • Layer thickness measurement
  • Contour and form (2D, 3D)
  • Macro and micro geometries
  • Determination of flatness and coplanarity
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf CP / CL select | Art. no. 6350010
Measuring speed 4 kHz
Workpiece weight (max.) in kg 10 kg
Measuring principle Chromatic-confocal
Languages German , English , French , Italian , Spanish , Portugese , Polish , Russian , Turkish , Chinese , Japanese , Korean
Power supplied 100 - 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178, …

Variety of applications for our products

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Large measuring range
Complete freedom of portal design and flexible component selection from a module building set.
Automated processes
Fully automated, database-based pallet measurements with automated measuring and evaluation sequence (user-dependent one click solution).
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