MarSurf | 3D surface measurement

MarSurf CM explorer

Art. no. 6350000

Flexible all-round measuring solution

The MarSurf CM explorer is a compact confocal microscope for the accurate three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.

MarSurf CM <i>explorer</i>
MarSurf CM <i>explorer</i>
Flexible all-round measuring solution

The MarSurf CM explorer is suitable for use in test laboratories and equipped for quality assurance in production environments due to its robust construction and insensitivity to environmental influences.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf CM explorer | Art. no. 6350000
Resolution up to 2 (nm) vertical
Measuring speed up to 100fps
Workpiece weight (max.) in kg 10 kg
Measuring principle

High-performance LED (505 nm / white)

Languages German , English , French , Italian , Spanish , Portugese , Polish , Russian , Turkish , Chinese , Japanese , Korean
Other Collision detection in xyz direction
Power supplied 100 - 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178, …
Dimensional drawing 1

Variety of applications for our products

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume  

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Wide range of workpieces
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Intuitive handling
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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