Maximum precision for extremely smooth surfaces
Measure structures and topographies in the sub-nanometer range
Do you want to measure the finest roughness, step heights and planes in the nanometer range? Then you should get to know the new, highly innovative white light interferometer from Mahr!
Download the brochure now for free!
The brochure "Optical Metrology for Surface Analysis" from Mahr informs you on 92 pages about application areas, measuring technologies and software solutions and goes into dedicated detail about the portfolio.