MarSurf 3D | 3D surface measurement

MarSurf 3D CM expert

Art. no. 6350002

The MarSurf CM expert is a powerful confocal microscope for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf 3D CM <i>expert</i>
MarSurf 3D CM <i>expert</i>
High-performance laboratory and QA system

The MarSurf CM expert is suitable for use in test laboratories and equipped for quality assurance in production environments due to its robust construction and insensitivity to environmental influences. 
With additional manual Z positioning, a large x and y travel range and the possibility of automation, it offers excellent ease of use. 
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf 3D CM expert | Art. no. 6350002
Positioning volume x 100 mm
Positioning volume y 100 mm
Positioning volume z 70 mm
Power supplied 100 - 240 V
Measuring principle Confocal
High-performance LED (505nm / white)
Languages German , English , French , Italian , Spanish , Portugese , Polish , Russian , Turkish , Chinese , Japanese , Korean

Variety of applications for our products

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
Correct, reproducible measurement
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Freely programmable measuring sequences
Fully automated, database-based pallet measurements with automated measuring and evaluation sequence (user-dependent one click solution).
Intuitive handling
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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