MarSurf 3D | 3D surface measurement

MarSurf 3D WI 50

Nr art. 6355001

The MarSurf WI 50 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf 3D WI 50
MarSurf 3D WI 50
Flexible all-round measuring solution

Flexible all-round measuring solutions all the time - wherever it comes down to sub-nanometers: That’s what the MarSurf WI 50 stands for. The high-precision measuring tools for research and quality assurance deliver reliable 3D measuring values – quickly and easily in just a few steps.  Thanks to its HD stitching function, the MarSurf WI 50 boasts consistently high resolution, even on large measuring surfaces. The integrated collision detection offers users a high level of safety in all directions – both for the workpiece and the instrument itself.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf 3D WI 50 | Nr art. 6355001
Napięcie zasilania 100 - 240 V
Zasada pomiaru White light interferometer
High-power LED (650 nm / white)

Różnorodne obszary wykorzystania naszego produktu

Mechanical engineering
Qualification and quantification of the roughness, geometry, and wear volume

Electronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free products

Medical technology
Quality assurance of medical surfaces in production and the laboratory

Materials science
Optimization of functional features on new surfaces and products
 
Microsystems technology
Measurement of complex surface geometries of the smallest components with nanometer precision
Prawidłowy, powtarzalny pomiar
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Szeroki zakres przedmiotów obrabianych
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Intuicyjna obsługa
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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