MarSurf | 3D surface measurement

MarSurf CM plus explorer 100

Nr art. 6350027

The new MarSurf CM explorer-series is the ultimate confocal microscope for the accurate three-dimensional measurement and analysis of surfaces – non-contact, independent of material, and fast.

MarSurf CM <i>plus explorer</i> 100<br/>
Flexible all-round measuring solution

The powerful MarSurf CM devices stand for reliable measurement on all surfaces - they offer users high resolution with maximum robustness, edge acceptance and dynamics. In addition, the state-of-the-art tools allow ultra-fast measurements (up to 4x faster than before) with a high measurement point density, which ensure high-quality and unfiltered raw data. By selecting the CM explorer or CM plus explorer variant for the highest demands, the system can be adapted to your application with up to 2x better repeatability and measurement uncertainty.
Typical measuring tasks
  • Roughness measurements as per
    ISO 21920 / 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf CM plus explorer 100
| Nr art. 6350027
Powiększenie obiektywu 5x - 100x
maks. masa próbki 10 kg
Napięcie zasilania 100-240 V
Zasada pomiaru patented conofocal method
Wysokość próbki (do maks.) 70 mm (on request)
Źródło światła High-performance LED (505 nm / white)
Interfejs próbny Reflectivity 0.1 - 100% coated, uncoated, reflective to diffuse
Szum pomiarowy (moduł piezo) 1 nm
Szum pomiarowy (jednostka regulacji) 5 nm
Rewolwer manual / motorized variant
Objętość pozycjonowania x 100 mm
Objętość pozycjonowania y 100 mm
Objętość pozycjonowania z 70 mm
Uzupełnienie dla objętości pozycjonowania x y z Extenstion z-positioning volume on request
Języki: Niemiecki , Angielski , Francuski , Włoski , Hiszpański , Portugalski , Polski , Rosyjski , Turecki , Chiński , Japoński , Koreański

Różnorodne obszary wykorzystania naszego produktu

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
Prawidłowy, powtarzalny pomiar
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Szeroki zakres przedmiotów obrabianych
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Intuicyjna obsługa
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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