Mahr | Product news

Optical surface measurement: effective, fast, precise

Marketing Team
Mahr has relaunched its high-performance confocal microscopes from the MarSurf CM explorer product line.

Mahr has relaunched its powerful confocal microscopes from the MarSurf CM explorer product line. With the compact table-top systems, you can measure surfaces in three dimensions without contact, regardless of the material and extremely quickly and precisely.

Thanks to their robust design and insensitivity to environmental influences, the devices are suitable for use in test and inspection laboratories as well as for quality assurance in production. The confocal microscopes deliver precise and repeatable 3D measurements of almost all materials, such as metal, glass, ceramics, semiconductors, polymers or organic materials, in just a few seconds.

The areas of application for the optical systems are just as diverse. They are used for roughness measurements in accordance with DIN EN ISO 21920 / 25178, topography measurements such as volume, wear, isotropy or measurements of micro-geometries and layer thicknesses. The devices determine quantitatively traceable 3D characteristic values and are therefore suitable for many industries such as the following:

  • Automotive industry
  • Mechanical engineering
  • Eectronics and semiconductor industry
  • Microsystems technology
  • Optics
  • Medical technology
  • Materials management

 

Two variants to choose from

The MarSurf CM explorer product line offers you user-independent and fully automatic measurements with a travel range of 100 x 100 mm and therefore uncomplicated operation. Depending on your requirements and measuring tasks, you can choose between the two variants MarSurf CM explorer 100 or MarSurf CM plus explorer 100, both of which have a very high repeat accuracy.

Patented multi-pinhole technology for ultra-fast image acquisition

The confocal microscopes guarantee their performance with ultra-fast image acquisition at high measuring point density thanks to the specially developed and patented multi-pinhole technology. This is a particularly low-noise process that ensures high-quality, unfiltered raw data. The devices also offer you high resolution with maximum robustness, edge acceptance and dynamics. They are also characterized by extremely low stray light and robust signaling with high light yield. As a result, they achieve height resolutions down to the nanometer range.

Would you like to find out more about optical measurement technology for surface analysis from Mahr?

On our website you will find

Info
To top