MarSurf | Contour measuring station

MarSurf CD 140 AF

Nr art. 6269052

The entry into contour metrology from Mahr Fast and precise measurements - made possible by the unique new contour measuring device MarSurf CD 140 AF

MarSurf CD 140 AF
Speedy measurements
  • Short measuring times thanks to high positioning and measuring speeds
  • Space-saving measuring station for fast contour measurement
  • Quickly change the probe arm without tools thanks to a magnetic mount – no recalibration required
  • Measuring force selection prevents measurement errors


Flexible and versatile
  • Workpiece support plate with 25 mm travel path
  • Large measuring range of 70 mm for versatile use
  • Maximum handling flexibility thanks to support plate with 50 mm bore dimension
  • Wide selection of probe arms and accessory parts

Comprehensive software package
  • Measurement of double contours e.g., for determining diameters
  • Optional roughness measurement from Rz 2 µm possible
  • Simple and intuitive contour measurement and evaluation
  • Start Quick & Easy programs by importing DMC codes

MarSurf CD 140 AF | Nr art. 6269052
Rozdzielczość 20 nm
Nacisk pomiarowy (N) 4 mN to 30 mN, software adjustable
Prędkość pomiaru 0.1 mm/s do 10 mm/s
Prędkość pozycjonowania w osi X min. 0.1 mm/s
Prędkość pozycjonowania w osi X maks. 200 mm/s
Prędkość pozycjonowania w osi X 0.1 - 200 mm/s
Czujnik Contour tracing system
Masa (brutto) 38 KG
Masa mierzonego elementu maks. 1.5 kg
Pozostałe machine weight: 35 kg
Zakres pomiarowy mm 70 mm with probe arm length 350 mm
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