MarSurf 3D | Medición 3D en toda la superficie

MarSurf 3D WI 100

Nº de artículo 6355002

The MarSurf WI 100 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf 3D WI 100
MarSurf 3D WI 100
High-performance laboratory and QA system

The high-end MarSurf WI 100 instrument features an extended working area in xyz direction for especially large sample volumes: Simply operate the adjustment on the side, which can be used to move the additional manual Z-axis, and measure XXL components.
Due to its robust design, the MarSurf WI 100 is not only suitable for use in test and inspection laboratories, but is also ideally equipped for quality assurance in production environments.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf 3D WI 100 | N.º de referencia 6355002
Alimentación de corriente 100 - 240 V
Principio de medición White light interferometer
High-power LED (650 nm / white)

Múltiples campos de aplicación de nuestro producto

Ingeniería mecánica
Cualificar y cuantificar rugosidad, geometría y grado de desgaste

Electrónica y semiconductores
Inspección de piezas hasta el rango de los subnanómetros para obtener productos sin defectos

Ingeniería médica
Garantía de calidad de superficies biomédicas en la producción y en el laboratorio

Ciencias de los materiales
Optimización de las propiedades de funcionamiento de superficies y productos nuevos
 
Tecnología de microsistemas
Mida geometrías complejas de superficies de piezas muy pequeñas con una precisión de nanómetros
Medición correcta y reproducible
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Secuencias de medición libremente programables
Fully automated, database-based pallet measurements with automated measuring and evaluation sequence (user-dependent one click solution).
Manejo intuitivo
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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