MarSurf 3D | Medición 3D en toda la superficie

MarSurf 3D WI 50 M

Nº de artículo 6355000

The MarSurf WI 50M is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast

MarSurf 3D WI 50 M
MarSurf 3D WI 50 M
High performance entry-level solution

Precise measurement in the sub-nanometer range – simple with the new MarSurf WI 50 M. With an intuitive software user guide and very user-friendly design, this 3D measuring instrument is ideal for everyday use in the laboratory and quality management.
The new WI 50 M meets all the requirements of your measuring tasks in the nanometer range – offering maximum performance and impressive value for money. With a minimalistic approach, compact design and large installation space, the tool lives up to its reputation as “an optimal entry-level solution.  

Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
MarSurf 3D WI 50 M | N.º de referencia 6355000
Alimentación de corriente 100 - 240 V
Principio de medición

White-Light-Interferometer 
High-performance LED (650 nm / white)

Múltiples campos de aplicación de nuestro producto

Ingeniería mecánica
Cualificar y cuantificar rugosidad, geometría y grado de desgaste

Electrónica y semiconductores
Inspección de piezas hasta el rango de los subnanómetros para obtener productos sin defectos

Ingeniería médica
Garantía de calidad de superficies biomédicas en la producción y en el laboratorio

Ciencias de los materiales
Optimización de las propiedades de funcionamiento de superficies y productos nuevos
 
Tecnología de microsistemas
Mida geometrías complejas de superficies de piezas muy pequeñas con una precisión de nanómetros
Medición correcta y reproducible
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Amplia gama de piezas de trabajo
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Manejo intuitivo
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
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