Marameter | Indicating plug gage

Marameter 844 D-HR

Art. no. 4484546

844 D-HR Indicating plug gage
Nominal size: >30-40
Measuring span in mm: 0.2
Connection thread g: M10x1
Design: For general holes, for tol. < 10 µm
Material Contact surface: carbide

Marameter 844 D-HR
Product type 844 D-HR
Measuring range mm >30-40
Measuring span 0.2 mm
Repeatability fw (µm) 1 µm
Manufacturing tolerance -0.01 / -0.02
Dimensions a 15 mm | b 38.2 mm | c 20 mm | e 3.5 mm |
Dimensional drawing 1

Variety of applications for our products

Standard version for very tight tolerance fields less than 10 µm
Manufacturing tolerance of the guide cylinder reduced to 0.01 mm (±5 µm) to reduce the axial and radial measuring influences
  • For the rapid testing of diameter, roundness and conicity of bores
  • Ideal for testing batches with very tight tolerance fields less than 10 µm
  • Rocking in the bore is not required to determine diameter
  • Therefore ideal for use in conjunction with digital display units and for subsequent processing of measured values
Marameter | Indicating plug gage

Marameter 844 D-HR

Art. no. 4484546

844 D-HR Indicating plug gage
Nominal size: >30-40
Measuring span in mm: 0.2
Connection thread g: M10x1
Design: For general holes, for tol. < 10 µm
Material Contact surface: carbide

Marameter 844 D-HR
Product type 844 D-HR
Measuring range mm >30-40
Measuring span 0.2 mm
Repeatability fw (µm) 1 µm
Manufacturing tolerance -0.01 / -0.02
Dimensions a 15 mm | b 38.2 mm | c 20 mm | e 3.5 mm |
Dimensional drawing 1

Variety of applications for our products

Standard version for very tight tolerance fields less than 10 µm
Manufacturing tolerance of the guide cylinder reduced to 0.01 mm (±5 µm) to reduce the axial and radial measuring influences
  • For the rapid testing of diameter, roundness and conicity of bores
  • Ideal for testing batches with very tight tolerance fields less than 10 µm
  • Rocking in the bore is not required to determine diameter
  • Therefore ideal for use in conjunction with digital display units and for subsequent processing of measured values
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