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Optisches 3D-Profilometer für die Qualitätskontrolle
Mit der MarSurf CP select -Technologie messen Sie erheblich schneller als mit herkömmlichen Tastsystemen. Profitieren Sie von der Vielzahl effektiver Features:
- Hohe Messgeschwindigkeit bei großem Höhenmessbereich
- Berührungslos und zerstörungsfrei messen dank Farbübersichtskamera
- Motorisierte Z-Achse & Messbereichserweiterung durch Z-Stitching
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High repeatability - fully automated on request
The granite construction and the use of first-class components guarantee a high repeatability of the measurements. At the same time, the CP select is fully automatable and can be conveniently integrated into quality assurance processes via industrial interfaces.
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Ultra-fast line sensor for large-area 3D measurement
The MarSurf CL select offers fast 3D acquisition of particularly large measurement areas with high measurement precision at the same time.
- Large-area 3D measurements at very high measuring speed.
- Excellent dynamics and precision
- Layer thickness measurement and measurement of transparent materials
- Non-contact and non-destructive measurement
- Can be automated
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Multiple topography line acquisition in a few seconds
Instead of just one profile, 192 parallel profile lines are recorded, allowing topographies to be acquired from the μm to the cm range in just a few seconds. Due to the fast measuring speed, high throughput rates can be achieved. This saves you a lot of time compared to the classic profilometer.
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Precise acquisition thanks to excellent dynamics
Profile data on almost all surfaces with varying reflection properties and inclinations are recorded with high precision thanks to the high dynamics and guarantee a high repeatability of the measurements.